most citedExtended X-ray absorption fine structure study of the Er bonding in AlNO:Er x films with x 3.6%

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cond-mat.mtrl-sci2019★ 3 cited

Extended X-ray absorption fine structure study of the Er bonding in AlNO:Er x films with x 3.6%

M. Katsikini, V. Kachkanov, Pascal Boulet +3

The structural properties of Er-doped AlNO epilayers grown by radio frequency magnetron sputtering were studied by Extended X-ray Absorption Fine Structure (EXAFS) spectra recorded…