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Quantitative determination of twist angle and strain in Van der Waals moiré superlattices
Steven J. Tran, Jan-Lucas Uslu, Mihir Pendharkar +9
Scanning probe techniques are popular, non-destructive ways to visualize the real space structure of Van der Waals moirés. The high lateral spatial resolution provided by these tec…
Torsional Force Microscopy of Van der Waals Moirés and Atomic Lattices
Mihir Pendharkar, Steven J. Tran, Gregory Zaborski +13
In a stack of atomically-thin Van der Waals layers, introducing interlayer twist creates a moiré superlattice whose period is a function of twist angle. Changes in that twist angle…
Super-geometric electron focusing on the hexagonal Fermi surface of PdCoO
Maja D. Bachmann, Aaron L. Sharpe, Arthur W. Barnard +6
Geometric electron optics may be implemented in solid state when transport is ballistic on the length scale of a device. Currently, this is realized mainly in 2D materials characte…