108 citations · 122 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2020★ 14 cited
Multibeam Electron Diffraction
Xuhao Hong, Steven E Zeltmann, Benjamin H Savitzky +5
One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam e…
physics.app-ph2019★ 108 cited
Patterned Probes for High Precision 4D-STEM Bragg Measurements
Steven E Zeltmann, Alexander Müller, Karen C Bustillo +4
Nanoscale strain mapping by four-dimensional scanning transmission electron microscopy (4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a seque…