18 citations · 20 across the 6 of their papers we have counts for
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stat.ME2021
Registration-free localization of defects in 3-D parts from mesh metrology data using functional maps
Xueqi Zhao, Enrique del Castillo
Spectral Laplacian methods, widely used in computer graphics and manifold learning, have been recently proposed for the Statistical Process Control (SPC) of a sequence of manufactu…
stat.AP2021
A Registration-free approach for Statistical Process Control of 3D scanned objects via FEM
Xueqi Zhao, Enrique del Castillo
Recent work in on-line Statistical Process Control (SPC) of manufactured 3-dimensional (3-D) objects has been proposed based on the estimation of the spectrum of the Laplace-Beltra…