most citedOn Calibration of a Nominal Structure-Property Relationship Model for Chiral Sculptured Thin Films by Axial Transmittance Measurements

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physics.optics2019★ 37 cited

On Calibration of a Nominal Structure-Property Relationship Model for Chiral Sculptured Thin Films by Axial Transmittance Measurements

Joseph A. Sherwin, Akhlesh Lakhtakia, Ian J. Hodgkinson

A chiral sculptured thin film is fabricated from patinal titanium oxide using the serial bideposition technique. Axial transmittance spectrums are measured over a spectral region e…