3 papers
cond-mat.mtrl-sci2026
On the capacitance gradient description in Heterodyne Kelvin Probe Force Microscopy
Hugo Valloire, Sylvain Clair, Christian Loppacher +2
Kelvin probe force microscopy (KPFM) probes local surface-potential variations through the electrostatic force between a conductive tip and a surface, which depends on the potentia…
cond-mat.mtrl-sci2026
Inverse heterodyne effect in bimodal Kelvin probe force microscopy
Hugo Valloire, Sylvain Clair, Christian Loppacher +2
Heterodyne Kelvin probe force microscopy (He-KPFM) enables high-sensitivity electrostatic measurements by converting a bias-modulated interaction into a resonant response at a high…
cond-mat.mes-hall2019
Forming Weakly Interacting Multi Layers of Graphene by using Atomic Force Microscope Tip Scanning and Evidence of Competition Between Inner and Outer Raman Scattering Processes Piloted by Structural Defects
C. Pardanaud, A. Merlen, K Gratzer +8
We report on an alternative route based on nanomechanical folding induced by AFM tip to obtain weakly interacting multi-layer graphene (wi-MLG) from a chemical vapor deposition (CV…