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cond-mat.mtrl-sci2025
The Microscopic Structure of Stacking Faults in SrNaNbO
Robin Sjökvist, Yining Xie, Zabeada Aslam +4
Stacking faults and other topological defects in ferroics can have a significant influence on the electronic and mechanical properties of the material. Here, regular stacking fault…
physics.ins-det2025
Quantifying the Full Damage Profile of Focused Ion Beams via 4D-STEM Precession Electron Diffraction and PSNR Metrics
M. G. Masteghin, Z. P. Aslam, A. P. Brown +4
Focused ion beams (FIBs) are widely used in nanofabrication for applications such as circuit repair, ultra-thin lamella preparation, strain engineering, and quantum device prototyp…