11 citations · 25 across the 10 of their papers we have counts for
4 papers · 1 filter
Machine learning for classifying and interpreting coherent X-ray speckle patterns
Mingren Shen, Dina Sheyfer, Troy David Loeffler +4
Speckle patterns produced by coherent X-ray have a close relationship with the internal structure of materials but quantitative inversion of the relationship to determine structure…
Non-destructive Depth-Resolved Characterization of Residual Strain Fields in High Electron Mobility Transistors using Differential Aperture X-ray Microscopy
Darren C. Pagan, Md Abu Jafar Rasel, Rachel E. Lim +3
Localized residual stress and elastic strain concentrations in microelectronic devices often affect the electronic performance, resistance to thermomechanical damage, and, likely,…
Digital autofocusing of a coded-aperture Laue diffraction microscope
Doga Gursoy, Dina Sheyfer, Michael Wojcik +2
To provide optimal depth resolution with a coded-aperture Laue diffraction microscope, an accurate position of the coded-aperture and its scanning geometry need to be known. Howeve…
Depth-resolved Laue microdiffraction with coded-apertures
Doga Gursoy, Dina Sheyfer, Michael Wojcik +2
We introduce a rapid data acquisition and reconstruction method to image the crystalline structure of materials and associated strain and orientations at micrometer resolution usin…