3 papers
physics.app-ph2019
Determination of fracture toughness of thin-film amorphous silicon using spiral crack structures
Torsten Bronger
We prepared thin layers of amorphous silicon by deposition of a liquid-phase polysilane precurser on glass substrate. Raman scattering provides evidence for residual tensile stress…
cond-mat.mtrl-sci2019
Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements
Torsten Bronger, Oleksandr Astakhov, Reinhard Carius
We study the electronic transport in lightly phosphorus-doped hydrogenated microcrystalline silicon (c-Si:H) and nominally undoped hydrogenated silicon carbide (c-SiC:H) by t…
physics.app-ph2019
Influence of hydrogen radicals treatment on layers and solar cells made of solution-processed amorphous silicon
Torsten Bronger, Jan Wördenweber, Paul Wöbkenberg +3
Solution-processed amorphous silicon is a promising material for semiconductor devices. Unfortunately, its manufacturing leaves a high density of defects in the layer, which can be…