8 citations · 31 across the 8 of their papers we have counts for
5 papers · 1 filter
Fine residual stress distribution measurement of steel materials by SOI pixel detector with synchrotron X-rays
Ryutaro Nishimura, Shunji Kishimoto, Toshihiko Sasaki +4
Residual stress is an important factor governing evaluating and controlling the quality of metal materials in industrial products. X-ray measurements provide one of the most effect…
Development of a new high-speed data acquisition system prototype for SOI pixel detector using SiTCP-XG, a 10-gigabit Ethernet network processor
Ryutaro Nishimura, Shunji Kishimoto, Yasuo Arai +1
We are developing a new readout board with a newer generation field-programmable gate array (FPGA) and the 10-gigabit ethernet to improve the performance and usability of the curre…
Energy response of X-rays under high flux conditions using a thin APD for the energy range of 6-33 keV
T. Masuda, T. Hiraki, H. Kaino +10
This paper reports on the demonstration of a high-rate energy measurement technique using a thin depletion layer silicon avalanche photodiode (Si-APD). A dedicated amplitude-to-tim…
Development of high-speed X-ray imaging system for SOI pixel detector
Ryutaro Nishimura, Yasuo Arai, Toshinobu Miyoshi +3
We are now developing new X-ray imaging system by using Silicon-On-Insulator (SOI) Pixel Detectors. The SOI detector is a monolithic radiation imaging detector based on a 0.2um FD-…
Application of SOI Area Detectors to Synchrotron Radiation X-ray Experiments
Ryo Hashimoto, Noriyuki Igarashi, Reiji Kumai +1
Application of new detectors using Silicon-On-Insulator (SOI) technology has been started in the Photon Factory, KEK. This project has two purposes. The first purpose is to develop…