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cond-mat.mtrl-sci2000★ 78 cited
Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope
D. E. Steinhauer, C. P. Vlahacos, F. C. Wellstood +5
We describe the use of a near-field scanning microwave microscope to image the permittivity and tunability of bulk and thin film dielectric samples on a length scale of about 1 mic…
cond-mat.mtrl-sci2000
Near-Field Microwave Microscopy of Materials Properties
Steven M. Anlage, D. E. Steinhauer, B. J. Feenstra +2
Near-field microwave microscopy has created the opportunity for a new class of electrodynamics experiments of materials. Freed from the constraints of traditional microwave optics,…