40 citations · 42 across the 6 of their papers we have counts for
4 papers · 1 filter
Revisiting contrast mechanism of lateral piezoresponse force microscopy
Jaegyu Kim, Seongwoo Cho, Jiwon Yeom +2
Piezoresponse force microscopy (PFM) has been widely used for nanoscale analysis of piezoelectric properties and ferroelectric domains. Although PFM is useful because of its simple…
Effect of Annealing Temperature on Minimum Domain Size of Ferroelectric Hafnia
Seokjung Yun, Hoon Kim, Myungsoo Seo +7
Here, we optimized the annealing temperature of HZO/TiN thin film heterostructure via multiscale analysis of remnant polarization, crystallographic phase, minimum ferroelectric dom…
Measurement Anomaly of Step Width in Calibration Grating using Atomic Force Microscopy
Gun Ahn, Yoon-Young Choi, Dean J. Miller +3
We imaged the topography of a silicon grating with atomic force microscopy (AFM) using different scan parameters to probe the effect of pixel pitch on resolution. We found variatio…
Visualization of Ion Channels in Membranes using Electrochemical Strain Microscopy
Suran Kim, Chungik Oh, Hongjun Kim +4
Polymer composite electrolytes of Nafion and phosphotungstic acid (PWA) are fabricated and analyzed using electrochemical strain microscopy (ESM) and conductive atomic force micros…