2 papers
physics.app-ph2019
Measurement Anomaly of Step Width in Calibration Grating using Atomic Force Microscopy
Gun Ahn, Yoon-Young Choi, Dean J. Miller +3
We imaged the topography of a silicon grating with atomic force microscopy (AFM) using different scan parameters to probe the effect of pixel pitch on resolution. We found variatio…
physics.app-ph2019
Visualization of Ion Channels in Membranes using Electrochemical Strain Microscopy
Suran Kim, Chungik Oh, Hongjun Kim +4
Polymer composite electrolytes of Nafion and phosphotungstic acid (PWA) are fabricated and analyzed using electrochemical strain microscopy (ESM) and conductive atomic force micros…