activity
20122019
most citedProbing of optical near-fields by electron rescattering on the 1 nm scale

82 citations · 222 across the 4 of their papers we have counts for

collaborators

6 papers

physics.acc-ph2019★ 2 cited

Scientific opportunies for bERLinPro 2020+, report with ideas and conclusions from bERLinProCamp 2019

Thorsten Kamps, Michael Abo-Bakr, Andreas Adelmann +38

The Energy Recovery Linac (ERL) paradigm offers the promise to generate intense electron beams of superior quality with extremely small six-dimensional phase space for many applica…

physics.ins-det2015

Designs for a Quantum Electron Microscope

Pieter Kruit, Richard G. Hobbs, Chung-Soo Kim +11

One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe…

physics.optics2015★ 77 cited

Large optical field enhancement for nanotips with large opening angles

Sebastian Thomas, Georg Wachter, Christoph Lemell +2

We theoretically investigate the dependence of the enhancement of optical near-fields at nanometric tips on the shape, size, and material of the tip. We confirm a strong dependence…

quant-ph2014★ 61 cited

Semitransparency in interaction-free measurements

Sebastian Thomas, Christoph Kohstall, Pieter Kruit +1

We discuss the effect of semitransparency in a quantum-Zeno-like interaction-free measurement setup, a quantum-physics based approach that might significantly reduce sample damage…

quant-ph2014

A microwave chip-based beam splitter for low-energy guided electrons

Jakob Hammer, Sebastian Thomas, Philipp Weber +1

We demonstrate the splitting of a low-energy electron beam by means of a microwave pseudopotential formed above a planar chip substrate. Beam splitting arises from smoothly transfo…

physics.optics2012★ 82 cited

Probing of optical near-fields by electron rescattering on the 1 nm scale

Sebastian Thomas, Michael Krüger, Michael Förster +2

We present a new method of measuring optical near-fields within ~1 nm of a metal surface, based on rescattering of photoemitted electrons. With this method, we precisely measure th…