28 citations · 31 across the 6 of their papers we have counts for
4 papers · 1 filter
Physics-Informed Neural Networks for Sparse Strain-Field Reconstruction in 4D-STEM
Roberto dos Reis, Gabriel T. dos Santos, Yukun Liu +2
Quantitative strain mapping using four-dimensional scanning transmission electron microscopy (4D-STEM) typically requires densely sampled scans that can damage beam-sensitive speci…
Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy
Stephanie M. Ribet, Steven E. Zeltmann, Karen C. Bustillo +6
In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the ma…
Defect contrast with 4D-STEM: Understanding crystalline order with virtual detectors and beam modification
Stephanie M. Ribet, Colin Ophus, Roberto dos Reis +1
Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-pr…
Direct Visualization of Electric Field induced Structural Dynamics in Monolayer Transition Metal Dichalcogenides
Akshay A. Murthy, Teodor K. Stanev, Roberto dos Reis +4
Layered transition metal dichalcogenides (TMDs) offer many attractive features for next-generation low-dimensional device geometries. Due to the practical and fabrication challenge…