activity
20242026
most citedDielectron production in proton-proton and proton-lead collisions at = 5.02 TeV

13 citations · 38 across the 20 of their papers we have counts for

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6 papers · 1 filter

physics.ins-det2026

Sensor operating point calibration and monitoring of the ALICE Inner Tracking System during LHC Run 3

D. Agguiaro, G. Aglieri Rinella, L. Aglietta +282

The new Inner Tracking System (ITS2) of the ALICE experiment began operation in 2021 with the start of LHC Run 3. Compared to its predecessor, ITS2 offers substantial improvements…

physics.ins-det2025

Time resolution of the ALICE Time-Of-Flight detector with the first Run 3 pp collisions at TeV

ALICE Collaboration

Particle identification (PID) is a fundamental aspect of the ALICE detector system, central to its heavy-ion and proton-proton physics programs. Among the different PID strategies,…

physics.ins-det2025

Further Characterisation of Digital Pixel Test Structures Implemented in a 65 nm CMOS Process

Gianluca Aglieri Rinella, Nicole Apadula, Anton Andronic +55

The next generation of MAPS for future tracking detectors will have to meet stringent requirements placed on them. One such detector is the ALICE ITS3 that aims to be very light at…

physics.ins-det2025

Yield, noise and timing studies of ALICE ITS3 stitched sensor test structures: the MOST

Jory Sonneveld, René Barthel, Szymon Bugiel +18

In the LHC long shutdown 3, the ALICE experiment upgrades the inner layers of its Inner Tracker System with three layers of wafer-scale stitched sensors bent around the beam pipe.…

physics.ins-det2025

Exploring unique design features of the Monolithic Stitched Sensor with Timing (MOST): yield, powering, timing, and sensor reverse bias

Mariia Selina, R. Barthel, S. Bugiel +18

Monolithic stitched CMOS sensors are explored for the upgrade of Inner Tracking System of the ALICE experiment (ITS3) and the R&D of the CERN Experimental Physics Department. To le…

physics.ins-det2024

Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process

Gianluca Aglieri Rinella, Giacomo Alocco, Matias Antonelli +91

Analogue test structures were fabricated using the Tower Partners Semiconductor Co. CMOS 65 nm ISC process. The purpose was to characterise and qualify this process and to optimise…