Structural defects induced by Fe-ion implantation in TiO2

B. Leedahl, D. A. Zatsepin, D. W. Boukhvalov +8

X-ray photoelectron spectroscopy (XPS) and resonant x-ray emission spectroscopy (RXES) measurements of pellet and thin film forms of TiO${}_2$ with implanted Fe ions are presented an…