collaborators

1 paper

cond-mat2000

Relation between Raman spectra and Structure of Amorphous Silicon

R. L. C. Vink, G. T. Barkema, W. F. van der Weg

In 1985, Beeman, Tsu and Thorpe established an almost linear relation between the Raman transverse-optic (TO) peak width and the spread in mean bond angle in a-Si. This relation is…