9 citations · 9 across the 3 of their papers we have counts for
3 papers
A simple KPFM-based approach for electrostatic-free topographic measurements: the case of MoS on SiO
Aloïs Arrighi, Nathan Ullberg, Vincent Derycke +1
A simple implementation of Kelvin probe force microscopy is reported that enables recording topographic images in the absence of any component of the electrostatic force. Our appro…
Heat dissipation in few-layer MoS2 and MoS2/hBN heterostructure
Alois Arrighi, Elena del Corro, Daniel Navarro Urrios +8
State-of-the-art fabrication and characterization techniques have been employed to measure the thermal conductivity of suspended, single-crystalline MoS2 and MoS2/hBN heterostructu…
Fracturing of polycrystalline MoS nanofilms
M. Sledzinska, G. Jumbert, M. Placidi +4
The possibility of tailoring the critical strain of 2D materials will be crucial for the fabrication of flexible devices. In this paper, the fracture in polycrystalline MoS2 films…