9 citations · 15 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2025★ 6 cited
Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component
S. V. Gabielkov, I. V. Zhyganiuk, A. D. Skorbun +4
The values of the signal-to-noise ratio are determined, at which the method of processing X-ray diffraction data reveals reflections with intensity less than the noise component of…
cond-mat.mtrl-sci2019★ 9 cited
Method of X-Ray Diffraction Data Processing for Multiphase Materials with Low Phase Contents
A. D. Skorbun, S. V. Gabielkov, I. V. Zhyganiuk +3
Amorphous, glass, and glass-ceramic materials practically always include a significant number (more than eight) of crystalline phases, with the contents of the latter ranging from…