activity
20192025
most citedMethod of X-Ray Diffraction Data Processing for Multiphase Materials with Low Phase Contents

9 citations · 15 across the 4 of their papers we have counts for

collaborators
Showing 2025Show all

1 paper · 1 filter

cond-mat.mtrl-sci2025★ 6 cited

Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component

S. V. Gabielkov, I. V. Zhyganiuk, A. D. Skorbun +4

The values of the signal-to-noise ratio are determined, at which the method of processing X-ray diffraction data reveals reflections with intensity less than the noise component of…