activity
20162025
most citedVortex states in a PbTiO ferroelectric cylinder

8 citations · 26 across the 10 of their papers we have counts for

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Showing cond-mat.mes-hallShow all

6 papers · 1 filter

cond-mat.mes-hall2025★ 1 cited

Unconventional criticality in -invariant loop-constrained Landau theory

Svitlana Kondovych, Asle Sudbø, Flavio S. Nogueira

We study an unconventional phase transition in ferroelectrics where the polarization field is constrained to be divergence-free, allowing only loop-like configurations. This local…

cond-mat.mes-hall2025★ 4 cited

Chiral breakdown engineered by mesoscale Dzyaloshinskii-Moriya interaction in biaxial magnetic nanotubes

Kostiantyn V. Yershov, Svitlana Kondovych, Denis D. Sheka

Curvilinear geometries in magnetic nanostructures provide a unique platform for exploring the interplay of symmetry, topology, and curvature in magnetization dynamics. In this work…

cond-mat.mes-hall2021★ 8 cited

Vortex states in a PbTiO ferroelectric cylinder

Svitlana Kondovych, Maksim Pavlenko, Yurii Tikhonov +2

The past decade's discovery of topological excitations in nanoscale ferroelectrics has turned the prevailing view that the polar ground state in these materials is uniform. However…

cond-mat.mes-hall2021★ 5 cited

Gate-tunable electron interaction in high-κ dielectric films

Svitlana Kondovych, Igor Luk'yanchuk, Tatyana I. Baturina +1

The two-dimensional (2D) logarithmic character of Coulomb interaction between charges and the resulting logarithmic confinement is a remarkable inherent property of high dielectric…

cond-mat.mes-hall2020★ 1 cited

Controllable skyrmion chirality in ferroelectrics

Yu. Tikhonov, S. Kondovych, J. Mangeri +9

Chirality, an intrinsic handedness, is one of the most intriguing fundamental phenomena in nature. Materials composed of chiral molecules find broad applications in areas ranging f…

cond-mat.mes-hall2016★ 2 cited

Nondestructive method of thin film dielectric constant measurements by two-wire capacitor

Svitlana Kondovych, Igor Luk'yanchuk

We suggest the nondestructive method for determination of the dielectric constant of substrate-deposited thin films by capacitance measurement with two parallel wires placed on top…