most citedElectrostatic potential mapping at ferroelectric domain walls by low-temperature photoemission electron microscopy

6 citations · 6 across the 1 of their papers we have counts for

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cond-mat.mtrl-sci2020★ 6 cited

Electrostatic potential mapping at ferroelectric domain walls by low-temperature photoemission electron microscopy

J. Schaab, K. Shapovalov, P. Schoenherr +10

Low-temperature X-ray photoemission electron microscopy (X-PEEM) is used to measure the electric potential at domain walls in improper ferroelectric Er0.99Ca0.01MnO3. By combining…