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physics.ins-det2016★ 7 cited
Device for measurement of thermal emissivity at cryogenic temperatures
Tomas Kralik, Pavel Hanzelka, Vera Musilova +1
In the described device, the thermal emissivity or absorptivity of the sample is measured by substitution of the radiative heat flow between two parallel surfaces by thermal output…
physics.ins-det2016★ 1 cited
Design and testing of low temperature part of an UHV SPM microscope
Jiri Frolec, Jakub Vonka, Pavel Hanzelka +3
We have developed low temperature part of an ultra high vacuum scanning probe microscope (UHV-SPM) working at variable temperature within the range from 20 K to 700 K. To achieve t…