most citedRobust multi-scale multi-feature deep learning for atomic and defect identification in Scanning Tunneling Microscopy on H-Si(100) 2x1 surface

5 citations · 5 across the 1 of their papers we have counts for

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1 paper

cond-mat.mtrl-sci2020★ 5 cited

Robust multi-scale multi-feature deep learning for atomic and defect identification in Scanning Tunneling Microscopy on H-Si(100) 2x1 surface

Maxim Ziatdinov, Udi Fuchs, James H. G. Owen +2

The nature of the atomic defects on the hydrogen passivated Si (100) surface is analyzed using deep learning and scanning tunneling microscopy (STM). A robust deep learning framewo…