2 papers
cs.AR2023
Implementation of Fast and Power Efficient SEC-DAEC and SEC-DAEC-TAEC Codecs on FPGA
Sayan Tripathi, Jhilam Jana, Jaydeb Bhaumik
The reliability of memory devices is affected by radiation induced soft errors. Multiple cell upsets (MCUs) caused by radiation corrupt data stored in multiple cells within memorie…
cs.AR2020
Design of SEC-DED and SEC-DED-DAEC Codes of different lengths
Sayan Tripathi, Jhilam Jana, Jaydeb Bhaumik
Reliability is an important requirement for both communication and storage systems. Due to continuous scale down of technology multiple adjacent bits error probability increases. T…