15 citations · 66 across the 8 of their papers we have counts for
6 papers · 1 filter
Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models
Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange +1
Typical design flows are hierarchical and rely on assembling many individual technology elements from standard cells to complete boards. Providers use compact models to provide sim…
Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux +2
Rapidly shrinking technology node and voltage scaling increase the susceptibility of Soft Errors in digital circuits. Soft Errors are radiation-induced effects while the radiation…
The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux +2
As an alternative to traditional fault injection-based methodologies and to explore the applicability of modern machine learning algorithms in the field of reliability engineering,…
Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux +2
The paper is proposing a methodology for modeling a gate-level netlist using a Graph Convolutional Network (GCN). The model predicts the overall functional de-rating factors of seq…
Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux +2
Selective mitigation or selective hardening is an effective technique to obtain a good trade-off between the improvements in the overall reliability of a circuit and the hardware o…
Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks
Thomas Lange, Maximilien Glorieux, Dan Alexandrescu +1
With technology scaling, lower supply voltages, and higher operating frequencies clock distribution networks become more and more vulnerable to transients faults. These faults can…