59 citations · 186 across the 7 of their papers we have counts for
Showing 2020Show all
2 papers · 1 filter
cond-mat.mtrl-sci2020★ 47 cited
Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post Acquisition Data Processing, Visualisation, and Structural Characterisation
Gary W. Paterson, Robert W. H. Webster, Andrew Ross +5
Fast pixelated detectors incorporating direct electron detection (DED) technology are increasingly being regarded as universal detectors for scanning transmission electron microsco…
physics.app-ph2020
Evaluation of different rectangular scan strategies for STEM imaging
Abner Velazco, Magnus Nord, Armand Béché +1
STEM imaging is typically performed by raster scanning a focused electron probe over a sample. Here we investigate and compare three different scan patterns, making use of a progra…