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cond-mat.mtrl-sci2021
Reducing electron beam damage through alternative STEM scanning strategies. Part I -- Experimental findings
Abner Velazco, Daen Jannis, Armand Béché +1
The highly energetic electrons in a transmission electron microscope (TEM) can alter or even completely destroy the structure of samples before sufficient information can be obtain…
cond-mat.mtrl-sci2021
Reducing electron beam damage through alternative STEM scanning strategies. Part II -- Attempt towards an empirical model describing the damage process
D. Jannis, A. Velazco, A. Béché +1
In this second part of a series we attempt to construct an empirical model that can mimick all experimental observations made regarding the role of an alternative interleaved scan…