47 citations · 86 across the 3 of their papers we have counts for
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cs.CV2020★ 39 cited
A Deep Learning Framework for Simulation and Defect Prediction Applied in Microelectronics
Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis +4
The prediction of upcoming events in industrial processes has been a long-standing research goal since it enables optimization of manufacturing parameters, planning of equipment ma…
cs.CV2020★ 47 cited
Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser Scans
Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis +4
A common source of defects in manufacturing miniature Printed Circuits Boards (PCB) is the attachment of silicon die or other wire bondable components on a Liquid Crystal Polymer (…