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20192022
most citedFully Convolutional Networks for Chip-wise Defect Detection Employing Photoluminescence Images

38 citations · 74 across the 5 of their papers we have counts for

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Showing 2020 · cs.CVShow all

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cs.CV2020

Rethinking Fully Convolutional Networks for the Analysis of Photoluminescence Wafer Images

Maike Lorena Stern, Hans Lindberg, Klaus Meyer-Wegener

The manufacturing of light-emitting diodes is a complex semiconductor-manufacturing process, interspersed with different measurements. Among the employed measurements, photolumines…