50 citations · 133 across the 9 of their papers we have counts for
9 papers
Topmetal-M: a novel pixel sensor for compact tracking applications
Weiping Ren, Wei Zhou, Bihui You +22
The Topmetal-M is a large area pixel sensor (18 mm * 23 mm) prototype fabricated in a new 130 nm high-resistivity CMOS process in 2019. It contains 400 rows * 512 columns square pi…
A direct-sampling RF receiver for MOLLER beam charge measurement
Yuan Mei, Shujie Li, John Arrington +5
We have developed and tested a direct-sampling RF receiver capable of measuring the amplitude of a 1497 MHz sinusoidal signal in 0.5 ms integration windows to within <10 ppm relati…
Topmetal CMOS direct charge sensing plane for neutrinoless double-beta decay search in high-pressure gaseous TPC
Yuan Mei, Xiangming Sun, Nu Xu
We propose a novel charge sensing concept for high-pressure Time Projection Chamber (TPC) to search for Neutrinoless Double-Beta Decay (NLDBD) with ton-scale isotope mass and beyon…
Cryogenic Characterization of 180 nm CMOS Technology at 100 mK
Roger Huang, Dario Gnani, Carl Grace +3
Conventional CMOS technology operated at cryogenic conditions has recently attracted interest for its uses in low-noise electronics. We present one of the first characterizations o…
PandaX-III: Searching for Neutrinoless Double Beta Decay with High Pressure Xe Gas Time Projection Chambers
Xun Chen, Changbo Fu, Javier Galan +67
Searching for the Neutrinoless Double Beta Decay (NLDBD) is now regarded as the topmost promising technique to explore the nature of neutrinos after the discovery of neutrino masse…
Detailed study of the column-based priority logic readout of Topmetal-II- CMOS pixel direct charge sensor
Mangmang An, Chufeng Chen, Chaosong Gao +13
We present the detailed study of the digital readout of Topmetal-II- CMOS pixel direct charge sensor. Topmetal-II- is an integrated sensor with an array of 72X72 pixels each capabl…
A Low-Noise CMOS Pixel Direct Charge Sensor, Topmetal-II-
Mangmang An, Chufeng Chen, Chaosong Gao +10
We report the design and characterization of a CMOS pixel direct charge sensor, Topmetal-II-, fabricated in a standard 0.35um CMOS Integrated Circuit process. The sensor utilizes e…
Development of a highly pixelated direct charge sensor, Topmetal-I, for ionizing radiation imaging
Yan Fan, Chaosong Gao, Guangming Huang +9
Using industrial standard 0.35μm CMOS Integrated Circuit process, we realized a highly pixelated sensor that directly collects charge via metal nodes placed on the top of each pixe…
CeLAND: search for a 4th light neutrino state with a 3 PBq 144Ce-144Pr electron antineutrino generator in KamLAND
A. Gando, Y. Gando, S. Hayashida +63
The reactor neutrino and gallium anomalies can be tested with a 3-4 PBq (75-100 kCi scale) 144Ce-144Pr antineutrino beta-source deployed at the center or next to a large low-backgr…