21 citations · 25 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2022★ 4 cited
Low-energy electron microscopy intensity-voltage data -- factorization, sparse sampling, and classification
Francesco Masia, Wolfgang Langbein, Simon Fischer +2
Low-energy electron microscopy (LEEM) taken as intensity-voltage (I-V) curves provides hyperspectral images of surfaces, which can be used to identify the surface type, but are dif…
cond-mat.mtrl-sci2020★ 21 cited
Massively strained VO2 thin film growth on RuO2
Simon Fischer, Jon-Olaf Krisponeit, Michael Foerster +3
Strain engineering vanadium dioxide thin films is one way to alter this material's characteristic first order transition from semiconductor to metal. In this study we extend the ex…