2 citations · 3 across the 4 of their papers we have counts for
5 papers
Systematic Unsupervised Recycled Field-Programmable Gate Array Detection
Yuya Isaka, Michihiro Shintani, Foisal Ahmed +1
With the expansion of the semiconductor supply chain, the use of recycled field-programmable gate arrays (FPGAs) has become a serious concern. Several methods for detecting recycle…
Adaptive Outlier Detection for Power MOSFETs Based on Gaussian Process Regression
Kyohei Shimozato, Michihiro Shintani, Takashi Sato
Outlier detection of semiconductor devices is important since manufacturing variation is inherently inevitable. In order to properly detect outliers, it is necessary to consider th…
Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process
Michihiro Shintani, Riaz-Ul-Haque Mian, Tomoki Nakamura +3
Wafer-level performance prediction has been attracting attention to reduce measurement costs without compromising test quality in production tests. Although several efficient metho…
Accelerating Parameter Extraction of Power MOSFET Models Using Automatic Differentiation
Michihiro Shintani, Aoi Ueda, Takashi Sato
The extraction of the model parameters is as important as the development of compact model itself because simulation accuracy is fully determined by the accuracy of the parameters…
Cycle-Accurate Evaluation of Software-Hardware Co-Design of Decimal Computation in RISC-V Ecosystem
Riaz-ul-haque Mian, Michihiro Shintani, Michiko Inoue
Software-hardware co-design solutions for decimal computation can provide several Pareto points to development of embedded systems in terms of hardware cost and performance. This p…