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math.AP2018
Analytical validation of the Yound-Dupré law for epitaxially-strained thin films
Elisa Davoli, Paolo Piovano
We present here an analysis of the regularity of minimizers of a variational model for epitaxially strained thin-films identified by the authors in the companion paper [Davoli E.,…
math.AP2018
Derivation of a heteroepitaxial thin-film model
Elisa Davoli, Paolo Piovano
A variational model for epitaxially-strained thin films on rigid substrates is derived both by Γ-convergence from a transition-layer setting, and by relaxation from a sharp-interfa…