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cond-mat2000
Memory Effect in Silicon Nitride in Silicon Devices
V. A. Gritsenko, Yu. N. Morokov, Yu. N. Novikov +1
The dominant dielectric used currently in silicon devices is silicon oxide. Its application for future devices will be impeded by several fundamental limitations which lead to low…
cond-mat2000
Nature of traps responsible for failure of MOS devices
V. A. Gritsenko, P. M. Lenahan, Yu. N. Morokov +1
A failure of chips in a huge amount of modern electronic devices is connected as a rule with the undesirable capturing of charge (electrons and holes) by traps in a thin insulating…