activity
19982019
most citedMemory Effect in Silicon Nitride in Silicon Devices

2 citations · 3 across the 8 of their papers we have counts for

collaborators

8 papers

q-bio.OT2019

Simple mathematical model of aging

Yu. N. Morokov

A simple mathematical model of the aging process for long-lived organisms is considered. The key point in this model is the assumption that the body does not have internal clocks t…

cond-mat.mes-hall2017

Elastic Strain Fields In Lateral Double Ge/Si Quantum Dots

Yu. N. Morokov, M. P. Fedoruk

Simulations of the elastic strain fields for double Ge/Si quantum dots located on the same wetting layer are carried out. The cluster approximation is used for the atomistic model…

cond-mat.mes-hall2016

Calculation of Elastic Strain Fields for Single Ge/Si Quantum Dots

Yu. N. Morokov, M. P. Fedoruk

An atomistic model based on the Keating potential and the conjugate gradient method are used for simulation of the strain fields for single Ge/Si quantum dots. Calculations are per…

cond-mat.mes-hall2016

Structures with Vertically Stacked Ge/Si Quantum Dots for Logical Operations

Yu. N. Morokov, M. P. Fedoruk, A. V. Dvurechenskii +2

Ge/Si structures with vertically stacked quantum dots are simulated to implement the basic elements of a quantum computer for operation with electron spin states. Elastic-strain fi…

cond-mat2000★ 2 cited

Memory Effect in Silicon Nitride in Silicon Devices

V. A. Gritsenko, Yu. N. Morokov, Yu. N. Novikov +1

The dominant dielectric used currently in silicon devices is silicon oxide. Its application for future devices will be impeded by several fundamental limitations which lead to low…

cond-mat2000★ 1 cited

Nature of traps responsible for failure of MOS devices

V. A. Gritsenko, P. M. Lenahan, Yu. N. Morokov +1

A failure of chips in a huge amount of modern electronic devices is connected as a rule with the undesirable capturing of charge (electrons and holes) by traps in a thin insulating…