Artificial Neural Network based Modelling for Variational Effect on Double Metal Double Gate Negative Capacitance FET

Yash Pathak, Laxman Prasad Goswami, Bansi Dhar Malhotra +1

In this work, we have implemented an accurate machine-learning approach for predicting various key analog and RF parameters of Negative Capacitance Field-Effect Transistors (NCFETs…