129 citations · 351 across the 15 of their papers we have counts for
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Achieving 5-angstrom-resolution diffraction contrast with an uncorrected electron probe and nanosized defect characterizations
Yao Li, Austin C. Houston, Ziang Yu +8
Atomic-resolution micrographs remain limited in application due to small field of view and low numbers of recorded defects. Defect imaging with reliable statistics in transmission…
Irradiation-induced amplification of electric fields at oxide interfaces as revealed by correlative DPC-STEM and DFT
Elizabeth A. Peterson, Dongye Liu, Sean H. Mills +5
Heterointerfaces are ubiquitous in modern devices, found in technologies ranging from microelectronics to structural components for energy applications. Many of these emerging tech…
Fragmenting Diffusion Pathways Confers Extraordinary Radiation Resistance in Refractory Multicomponent Alloys
Bin Xing, Bijun Xie, Wanjuan Zou +11
The accumulation and growth of vacancy clusters under irradiation is a pivotal degradation mode for structural materials in extreme environments. Even tungsten undergoes rapid defe…