11 citations · 11 across the 2 of their papers we have counts for
4 papers
Precise wavefront characterization of X-ray optical elements using a laboratory source
J. L. Dresselhaus, H. Fleckenstein, M. Domaracky +7
Improvements in X-ray optics critically depend on the measurement of their optical performance. The knowledge of wavefront aberrations, for example, can be used to improve the fabr…
On the use of multilayer Laue lenses with X-ray Free Electron Lasers
Mauro Prasciolu, Kevin T. Murray, Nikolay Ivanov +34
Multilayer Laue lenses were used for the first time to focus x-rays from an X-ray Free Electron Laser (XFEL). In an experiment, which was performed at the European XFEL, we demonst…
speckle-tracking: a Software Suite for Ptychographic X-ray Speckle Tracking
Andrew J. Morgan, Kevin T. Murray, Harry M. Quiney +2
In recent years, x-ray speckle tracking techniques have emerged as viable tools for wavefront metrology and sample imaging applications. These methods are based on the measurement…
Ptychographic X-ray Speckle Tracking with Multi Layer Laue Lens Systems
Andrew James Morgan, Kevin T. Murray, Mauro Prasciolu +19
The ever-increasing brightness of synchrotron radiation sources demands improved x-ray optics to utilise their capability for imaging and probing biological cells, nano-devices, an…