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quant-ph2021★ 82 cited
Optimal Scheme for Quantum Metrology
Jing Liu, Mao Zhang, Hongzhen Chen +2
Quantum metrology can achieve far better precision than classical metrology, and is one of the most important applications of quantum technologies in the real world. To attain the…
quant-ph2021★ 18 cited
Incompatibility measures in multi-parameter quantum estimation under hierarchical quantum measurements
Hongzhen Chen, Yu Chen, Haidong Yuan
The incompatibility of the measurements constraints the achievable precisions in multi-parameter quantum estimation. Understanding the tradeoff induced by such incompatibility is a…