139 citations · 504 across the 17 of their papers we have counts for
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Imaging and structure analysis of ferroelectric domains, domain walls, and vortices by scanning electron diffraction
Ursula Ludacka, Jiali He, Shuyu Qin +9
Direct electron detectors in scanning transmission electron microscopy give unprecedented possibilities for structure analysis at the nanoscale. In electronic and quantum materials…
Optimizing compositional and atomic-level information of oxides in atom probe tomography
Kasper Hunnestad, Constantinos Hatzoglou, Francois Vurpillot +5
Atom probe tomography (APT) is a 3D analysis technique that offers unique chemical accuracy and sensitivity with sub-nanometer spatial resolution. Recently, there is an increasing…
Moiré Fringes in Conductive Atomic Force Microscopy
L. Richarz, J. He, U. Ludacka +4
Moiré physics plays an important role for the characterization of functional materials and the engineering of physical properties in general, ranging from strain-driven transport p…