36 citations · 92 across the 9 of their papers we have counts for
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Measuring picometre-level displacements using speckle patterns produced by an integrating sphere
Morgan Facchin, Graham David Bruce, Kishan Dholakia
As the fields of optical microscopy, semiconductor technology and fundamental science increasingly aim for precision at or below the nanoscale, there is a burgeoning demand for sub…
Measurement of variations in gas refractive index with resolution using laser speckle
Morgan Facchin, Graham David Bruce, Kishan Dholakia
Highly-resolved determination of refractive index is vital in fields ranging from biosensing through to laser range-finding. Laser speckle is known to be a sensitive probe of the p…
Wavelength sensitivity of the speckle patterns produced by an integrating sphere
Morgan Facchin, Kishan Dholakia, Graham D. Bruce
Speckle metrology is a powerful tool in the measurement of wavelength and spectra. Recently, speckle produced by multiple reflections inside an integrating sphere has been proposed…