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Correlation Revival Eigenmodes for Differential Sensitivity in Speckle Metrology
Hal Gee, Morgan Facchin, Graham D. Bruce
Speckle metrology exploits the high sensitivity of scattered fields to parameters of interest, yet this also leaves measurements vulnerable to unintended perturbations. Here we emp…
Ultra-high precision speckle spectrometer enabling radio-frequency scale resolution of atomic spectra
Gabriel Britto Monteiro, Christopher Perrella, Sarah K. Scholten +4
Laser speckle, the granular intensity pattern arising from random optical interference, provides a high-dimensional encoding of spectral information that can be exploited for preci…
Measuring picometre-level displacements using speckle patterns produced by an integrating sphere
Morgan Facchin, Graham David Bruce, Kishan Dholakia
As the fields of optical microscopy, semiconductor technology and fundamental science increasingly aim for precision at or below the nanoscale, there is a burgeoning demand for sub…
Measurement of variations in gas refractive index with resolution using laser speckle
Morgan Facchin, Graham David Bruce, Kishan Dholakia
Highly-resolved determination of refractive index is vital in fields ranging from biosensing through to laser range-finding. Laser speckle is known to be a sensitive probe of the p…
Wavelength sensitivity of the speckle patterns produced by an integrating sphere
Morgan Facchin, Kishan Dholakia, Graham D. Bruce
Speckle metrology is a powerful tool in the measurement of wavelength and spectra. Recently, speckle produced by multiple reflections inside an integrating sphere has been proposed…
Speckle-based determination of the polarisation state of single and multiple laser beams
Morgan Facchin, Graham D. Bruce, Kishan Dholakia
Laser speckle is generated by the multiple interference of light through a disordered medium. Here we study the premise that the speckle pattern retains information about the polar…