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20202024
most citedUnderstanding grain boundary electrical resistivity in Cu: the effect of boundary structure

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cond-mat.mtrl-sci2024

Data-efficient 4D-STEM in SEM: Beyond 2D Materials to Metallic Materials

Ujjval Bansal, Amit Sharma, Barbara Putz +2

Four-dimensional scanning transmission electron microscopy (4D-STEM) is a powerful tool that allows for the simultaneous acquisition of spatial and diffraction information, driven…