most citedSimultaneous assessment of energy, charge state and angular distribution for medium energy ions interacting with ultra-thin self-supporting targets: a time-of-flight approach

1 citations · 1 across the 2 of their papers we have counts for

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5 papers

physics.ins-det20201 cited

Simultaneous assessment of energy, charge state and angular distribution for medium energy ions interacting with ultra-thin self-supporting targets: a time-of-flight approach

R. Holeňák, S. Lohmann, F. Sekula +1

We demonstrate simultaneous measurements of the charge state, energy and angular distribution of keV ions in transmission experiments through self-supporting foils. Using a time-of…

cond-mat.mtrl-sci2020

Trajectory-dependent electronic excitations by light and heavy ions around and below the Bohr velocity

Svenja Lohmann, Radek Holeňák, Daniel Primetzhofer

We present experiments demonstrating trajectory-dependent electronic excitations at low ion velocities, where ions are expected to primarily interact with delocalized valence elect…

physics.app-ph2020

Contrast modes in a 3D ion transmission approach at keV energies

R. Holeňák, S. Lohmann, D. Primetzhofer

We present options for visualizing contrast maps in 3D ion transmission experiments. Simultaneous measurement of angular distributions and flight time of ions transmitted through s…

physics.ins-det2020

Assessing electron emission induced by pulsed ion beams: a time-of-flight approach

Svenja Lohmann, Anna Niggas, Vincent Charnay +2

We present a method to measure the kinetic energy of electrons emitted upon ion impact via their time-of-flight. Pulsed beams of H, D, He and Ne ions with…

physics.app-ph2018

Accurate high-resolution depth profiling of magnetron sputtered transition metal alloy films containing light species: A multi-method approach

M. V. Moro, R. Holeňák, L. Zendejas Medina +2

We present an assessment of a multi-method approach based on ion beam analysis to obtain high-resolution depth profiles of the total chemical composition of complex alloy systems.…