activity
20182026
most citedAggregated Deep Local Features for Remote Sensing Image Retrieval

76 citations · 109 across the 24 of their papers we have counts for

collaborators

27 papers

cs.CV2026

BenthicFlow: Generating Extensible Underwater Environments via Flow Matching

Joaquín Figueira, Camile Lendering, Manfred Gonzalez-Hernandez +3

Computer vision applications for 3D scene understanding in underwater environments remain challenging due to the lack of high-quality 3D data and the inability of surface-trained m…

cs.CV2026

Auditing Frame-Level AUC in Weakly Supervised Video Anomaly Detection: Granularity, Resolution, and Scene Bias

Sara Abdulaziz, Egor Bondarev

Frame-level area under the ROC curve (AUC) is the dominant evaluation metric for weakly supervised video anomaly detection (WSVAD). Its standard form measures whether an anomalous…

cs.CV2026

Localizing to Debias: A Patch-Level Benchmark and Baseline for Weakly Supervised Spatial Anomaly Detection

Sara Abdulaziz, Abdulrahman Al-Abri, Giacomo D'Amicantonio +1

Despite growing interest in weakly supervised video anomaly detection (WSVAD), current methods struggle to bridge the gap between coarse temporal supervision and fine-grained spati…

cs.LG2026

ReFP-AD: Rectified Flow Preconditioning for Energy-Based Anomaly Detection

Camile Lendering, Erkut Akdag, Joaquín Figueira +1

Unified anomaly detection requires modeling highly heterogeneous normal data without access to anomalous samples. While foundation models like DINOv2 provide rich token representat…

cs.CV2026

AOI-SSL: Self-Supervised Framework for Efficient Segmentation of Wire-bonded Semiconductors In Optical Inspection

Joaquín Figueira, Rob Van Gastel, Giacomo D'Amicantonio +4

Segmentation models in automated optical inspection of wire-bonded semiconductors are typically device-specific and must be re-trained when new devices or distribution shifts appea…

cs.CV2026

Boxes2Pixels: Learning Defect Segmentation from Noisy SAM Masks

Camile Lendering, Erkut Akdag, Egor Bondarev

Accurate defect segmentation is critical for industrial inspection, yet dense pixel-level annotations are rarely available. A common workaround is to convert inexpensive bounding b…