activity
19982026
most citedSearching for low-mass dark matter particles with a massive Ge bolometer operated above-ground

246 citations · 4.9k across the 131 of their papers we have counts for

collaborators
Showing 2013Show all

7 papers · 1 filter

astro-ph.IM2013★ 8 cited

Niobium Silicon alloys for Kinetic Inductance Detectors

M. Calvo, A. D'Addabbo, A. Monfardini +8

We are studying the properties of Niobium Silicon amorphous alloys as a candidate material for the fabrication of highly sensitive Kinetic Inductance Detectors (KID), optimized for…

physics.ins-det2013★ 21 cited

Purification of molybdenum oxide, growth and characterization of medium size zinc molybdate crystals for the LUMINEU program

V. N. Shlegel, L. Berge, R. S. Boiko +45

The LUMINEU program aims at performing a pilot experiment on neutrinoless double beta decay of 100Mo using radiopure ZnMoO4 crystals operated as scintillating bolometers. Growth of…

astro-ph.CO2013★ 111 cited

Axion searches with the EDELWEISS-II experiment

E. Armengaud, Q. Arnaud, C. Augier +62

We present new constraints on the couplings of axions and more generic axion-like particles using data from the EDELWEISS-II experiment. The EDELWEISS experiment, located at the Un…

astro-ph.IM2013★ 9 cited

Latest Progress on the QUBIC Instrument

A. Ghribi, J. Aumont, E. S. Battistelli +60

QUBIC is a unique instrument that crosses the barriers between classical imaging architectures and interferometry taking advantage from both for high sensitivity and systematics mi…

physics.ins-det2013★ 63 cited

Background studies for the EDELWEISS dark matter experiment

E. Armengaud, C. Augier, A. Benoît +55

The EDELWEISS-II collaboration has completed a direct search for WIMP dark matter using cryogenic Ge detectors (400 g each) and 384 kgdays of effective exposure. A cross-se…

cond-mat.supr-con2013★ 22 cited

Effect of annealing on the superconducting properties of a-Nb(x)Si(1-x) thin films

O. Crauste, A. Gentils, F. Couëdo +5

a-Nb(x)Si(1-x) thin films with thicknesses down to 25 Å have been structurally characterized by TEM (Transmission Electron Microscopy) measurements. As-deposited or annealed films…