Characteristics of long-lived persistent spectral holes in $E{u}^{3+}:Y_{2}Si{O}_5$ at $1.2K$

René Oswald, Michael Hansen, Eugen Wiens +2

Properties of persistent spectral holes (SHs) relevant for frequency metrology have been investigated in the system $E{u}^{3+}:Y_{2}Si{O}_5$ (0.5%) at crystallographic site 1 and a t…