43 citations · 43 across the 1 of their papers we have counts for
3 papers
Measurement of swelling-induced residual stress in ion implanted SiC, and its effect on micromechanical properties
Alexander J. Leide, Richard I. Todd, David E. J. Armstrong
Ion implantation is widely used as a surrogate for neutron irradiation in the investigation of radiation damage on the properties of materials. Due to the small depth of damage, mi…
Raman spectroscopy of ion irradiated SiC: chemical defects, strain, annealing, and oxidation
Alexander J. Leide, Matthew J. Lloyd, Richard I. Todd +1
Raman spectroscopy has been used to identify defective bonding in neon and silicon ion irradiated single crystals of 6H-SiC. Observable differences exist in the C-C bonding region…
Warren-Averbach line broadening analysis from a time of flight neutron diffractometer
David M. Collins, Angus J. Wilkinson, Richard I. Todd
The well known Warren-Averbach theory of diffraction line profile broadening is shown to be applicable to time of flight data obtained from a neutron spallation source. Without mod…